The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Nov. 14, 2017
Applicant:

Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;

Inventors:

Maciej Kraszewski, Slupsk, PL;

Nils Haverkamp, Aalen, DE;

Andrzej Grzesiak, Oberkochen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/30164 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A specimen of an artificial marker is arranged on an object, the position of which is to be determined. The artificial marker defines a nominal marker pattern with nominal characteristics. The specimen embodies the nominal marker pattern with individual characteristics. One or more images of the specimen are captured while the specimen is arranged on the object. An image representation of the specimen is analyzed using a data set. The data set comprises measured data values representing the individual characteristics as individually measured on the first specimen. Position values representing a 3D position of the specimen relative to a coordinate system are determined. A 3D position of the object is determined based on the position values of the specimen.


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