The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Sep. 21, 2017
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Tetsuji Yamato, Yokohama, JP;

Hiroshi Imai, Koma, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2457 (2019.01); G06F 16/23 (2019.01); G06F 16/248 (2019.01); G06F 16/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24578 (2019.01); G06F 16/00 (2019.01); G06F 16/2379 (2019.01); G06F 16/248 (2019.01);
Abstract

A matching apparatus includes: a sensor-side metadata acquisition unit that acquires sensor-side metadata; an application-side metadata acquisition unit that acquires application-side metadata; a matching unit that performs matching between the sensor-side metadata and the application-side metadata in which a first related term that is related to a term in the acquired sensor-side metadata and a second related term that is related to a term in the acquired application-side metadata are in common with each other, and extracts a sensor candidate; and a dataflow control command instruction unit that transmits a dataflow control command that includes information that specifies the sensor extracted by the matching unit and an application.


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