The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Dec. 15, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Ingrid Christina Maria Flinsenberg, Eindhoven, NL;
Marc Aoun, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A device () for and a method of determining a length of a history of instances of a first type of data are provided. The device comprises a second data set unit (), a first data set unit (), a first conditional entropy unit (), a threshold unit (), and a length determining unit (). The first data set unit, the second data set unit and the threshold unit obtain input data. The first conditional entropy unit determines a first conditional entropy for a second data set given a first data set. The determining unit searches for a length of the relevant history by determining a smallest length for sequences of a reduced first set of data for which a second conditional entropy for the second set of data, given the reduced first set of data, is within a maximum entropy increase threshold from the first conditional entropy.