The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Jul. 25, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Hiroshi Iida, Tokyo, JP;

Norifumi Kikkawa, Tokyo, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 12/02 (2006.01); G06Q 30/02 (2012.01); G06Q 30/06 (2012.01); G06F 16/27 (2019.01);
U.S. Cl.
CPC ...
G06F 12/02 (2013.01); G06F 16/27 (2019.01); G06Q 30/02 (2013.01); G06Q 30/06 (2013.01);
Abstract

The present disclosure relates to an information processing apparatus, an information processing method, a program and an information processing system capable of executing processing that affects a database. In a case where it is instructed to conduct an A/B test that affects a database, a duplication processing unit executes processing for creating a test database by duplicating the database. In a case where it is instructed to terminate the A/B test, a write-back processing unit executes processing for writing back data of the test database to the original database. At this time, all of a plurality of pieces of data registered in the test database or a specified part of the data is selected and written back. The present technology is, for example, applied to a web system capable of conducting the A/B test.


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