The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Dec. 28, 2017
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Se Hyun Kim, Seoul, KR;

Jin Woong Kim, Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01); G06F 1/3234 (2019.01); G06F 11/16 (2006.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2094 (2013.01); G06F 1/3275 (2013.01); G06F 3/064 (2013.01); G06F 3/065 (2013.01); G06F 3/0619 (2013.01); G06F 3/0625 (2013.01); G06F 3/0634 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 3/0685 (2013.01); G06F 3/0688 (2013.01); G06F 11/1048 (2013.01); G06F 11/1076 (2013.01); G06F 11/1666 (2013.01); G06F 2201/805 (2013.01);
Abstract

Provided herein may be a memory system and a method of operating the same. The memory system may include a memory controller, and a plurality of memory devices coupled to the memory controller through a channel. Each of the memory devices may include a plurality of memory blocks, including a first memory block, the plurality of memory devices may constitute different ways, respectively, and a group of the first memory blocks respectively included in the plurality of memory devices may constitute a first super block. When any one of the first memory blocks included in the first super block is determined to be a bad block, the memory controller may be configured to generate a new second super block by replacing the first memory block determined to be the bad block with a second memory block.


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