The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Apr. 30, 2019
Accenture Global Solutions Limited, Dublin, IE;
Mahesh Venkataraman, Bangalore, IN;
Jothi Gouthaman, Chennai, IN;
Sunder Ranganathan Nochilur, Bangalore, IN;
Radhika Golden, Trivandrum, IN;
Accenture Global Solutions Limited, Dublin, IE;
Abstract
A method and system for fault analysis and prediction in an enterprise environment is described. In one embodiment, a method includes obtaining data from a plurality of sources in the enterprise environment. The plurality of sources includes at least one or more systems, users, or applications. The obtained data is associated with identifiers that include a theme selected from a set of themes and one or more keywords that are specific to each theme. The method includes generating a workflow for a user based on a session identifier and/or timestamps associated with activity by the user. The workflow identifies a time-based sequence of interactions by the user with the at least one or more systems or applications in the enterprise environment. The method also includes determining at least one fault identification or fault prediction based on the workflow and identifiers associated with the obtained data that corresponds to the workflow.