The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

May. 20, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Abhinav Kumar Singh, Bihar, IN;

Vikram Singh, Bangalore, IN;

Chandrashekar Tandavapura Jagadish, Karnataka, IN;

Ajith Mohan, Karnataka, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0604 (2013.01); G06F 3/0658 (2013.01); G06F 3/0679 (2013.01);
Abstract

A method for managing Logical Block Address (LBA) range overlap checking in a Non-Volatile Memory express (NVMe) based Solid State Drive (SSD) includes detecting, by an LBA-Overlap Check (LOC) module, an overlap between an LBA range of an incoming command with an LBA range of at least one outstanding command in an SSD controller, determining, by the LOC module, an overlap count value corresponding to the incoming command, where the overlap count value indicates occurrence of an overlap between the LBA range of the incoming command and the LBA range of the at least one outstanding command, and executing, by the SSD controller, the incoming command based on the overlap count value corresponding to the incoming command.


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