The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Feb. 14, 2019
Applicant:

SK Hynix Inc., Gyeonggi-Do, KR;

Inventors:

Seong Won Shin, San Jose, CA (US);

Yi Tong, San Jose, CA (US);

Seungwan Jung, Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0611 (2013.01); G06F 3/0653 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 12/0246 (2013.01); G06F 2212/1024 (2013.01); G06F 2212/7201 (2013.01);
Abstract

A data processing system includes a host device and a memory system including a plurality of units. The host device includes a workload generation component and an analysis component. The workload generation component concurrently transmits, to the memory system, a plurality of commands for the plurality of memory units. The analysis component receives, from the memory system, command completion messages corresponding to the plurality of commands; measures latencies of the plurality of commands based on the receiving of the command completion messages; and analyze a parallelism scheme of the plurality of memory units based the measured latencies.


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