The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Mar. 21, 2020
Guangdong University of Technology, Guangdong, CN;
Qiang Liu, Guangzhou Guangdong, CN;
Yuan Song, Guangzhou Guangdong, CN;
Jiewu Leng, Guangzhou Guangdong, CN;
Guixiang Lin, Guangzhou Guangdong, CN;
Hao Zhang, Guangzhou Guangdong, CN;
Guangdong University of Technology, Guangzhou, CN;
Abstract
The present invention relates to the field of intelligent machining, in particular to a parallel control method based on multi-period differential sampling and digital twinning technologies, the method comprising the following steps of: a. detecting machining conditions of dotting machine equipment by using a multi-period differential sampling technology; b. establishing a digital twinning control model; and c. controlling a simulation model of the dotting machine equipment according to a detection judgment result so as to perform parallel control on the dotting machine equipment. According to the parallel control method based on multi-period differential sampling and digital twinning modelling provided by the present invention, for the digital twinning model of the dotting machine equipment, the parallel control method establishes a simulation model and a detection model of the dotting machine equipment by using a virtual-real synchronization technology; simulation dotting machine equipment operates in synchronization with the physical dotting machine equipment.