The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Jun. 30, 2016
Applicant:

Tamron Co., Ltd., Saitama, JP;

Inventor:

Yoshito Iwasawa, Saitama, JP;

Assignee:

Tamron Co., Ltd., Saitama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 21/36 (2006.01); G02B 13/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/02 (2013.01); G02B 21/361 (2013.01); G02B 13/002 (2013.01);
Abstract

A small observation optical system having a high resolution, an observation imaging device that includes the observation optical system, an observation imaging system, an image forming lens system, and a method of adjusting the observation optical system. The observation optical system includes an objective lens system Gand an image forming lens system G, sequentially from the observation object side, and the image forming lens system Gforms an observation object image forms through the objective lens system G, on an image plane IP of an image sensor, and satisfies predetermined condition.


Find Patent Forward Citations

Iwasawa, Yoshito. (2021). Observation optical system, observation imaging device, observation imaging system, image forming lens system, and method of adjusting observation optical system (U.S. Patent No. 10921571). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10921571

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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