The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Jun. 14, 2019
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Mathias Nittka, Baiersdorf, DE;

Gregor Koerzdoerfer, Erlangen, DE;

Josef Pfeuffer, Kunreuth, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06T 7/00 (2017.01); G01R 33/48 (2006.01); G01R 33/561 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4828 (2013.01); G01R 33/4824 (2013.01); G01R 33/5608 (2013.01); G01R 33/5614 (2013.01); G06T 7/0016 (2013.01); G06T 11/005 (2013.01); G06T 11/008 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20182 (2013.01);
Abstract

In a magnetic resonance fingerprinting method and apparatus for improved determination of local parameter values of an examination object, in which at least two signal comparisons of acquired picture element time series are carried out with comparison signal curves for determination of parameter values. A further (subsequent) signal comparison takes into account results of a preceding signal comparison. This multi-stage determination of parameter values allows an increase of the spatial resolution and the precision with which the parameter values can be determined.


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