The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Jun. 27, 2018
Bar Ilan University, Ramat Gan, IL;
B. G. Negev Technologies and Applications Ltd. AT Ben-gurion University, Beer Sheva, IL;
Lior Klein, Ramat Gan, IL;
Mordechai Schultz, Holon, IL;
Vladislav Mor, Holon, IL;
Asaf Grosz, Ramat Gan, IL;
Shai Amrusi, Netivot, IL;
Igor Faivinov, Be'er Sheva, IL;
BAR-ILAN UNIVERSITY, Ramat Gan, IL;
B. G. Negev Technologies and Applications Ltd., at Ben-Gurion University, Beer-Sheva, IL;
Abstract
A planar Hall effect (PHE) sensor for measuring at an external magnetic field includes a plurality of elongated magnetic regions. Each magnetic region includes a ferromagnetic material that is magnetized along a longitudinal axis. The magnetic regions cross one another at an overlap region that is characterized by a plurality of easy magnetic axes. At least two pairs of electrical leads are each aligned along one of the easy magnetic axes. A current source may be connected to a first pair of the electrical leads to cause a current to flow through the overlap region along a first easy magnetic axis. A voltage measurement device may be connected to another pair of the electrical leads to measure a PHE voltage that is generated by a component of the external magnetic field that is perpendicular to the easy magnetic axis along which the overlap region is magnetized.