The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Jul. 05, 2017
Applicant:
Seagate Technology Llc, Cupertino, CA (US);
Inventors:
Jay Shah, Ahmedabad, IN;
Aniruddha Mukund Bhasale, Pune, IN;
Assignee:
SEAGATE TECHNOLOGY LLC, Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31723 (2013.01); G01R 31/31724 (2013.01); G01R 31/31727 (2013.01); G01R 31/318544 (2013.01); G01R 31/318555 (2013.01); G01R 31/318558 (2013.01);
Abstract
The disclosed technology facilitates programmable scan shift testing for a scan chain including at least a first segment of scan-flops connected in series with a second segment of scan-flops. The scan chain includes at least a first multiplexor positioned between the first segment and the second segment that is configured to selectively supply scan input from a test controller to the second segment while preventing the second segment from receiving an output of the first segment.