The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Aug. 14, 2017
Applicant:

Andrew J. Borleske, Garner, NC (US);

Inventor:

Andrew J. Borleske, Garner, NC (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/25 (2006.01); G01R 19/165 (2006.01); G01R 19/17 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 19/2509 (2013.01); G01R 19/16528 (2013.01); G01R 19/17 (2013.01); G01R 35/005 (2013.01);
Abstract

Systems, devices, and methods for a wide dynamic range current measurement with consumption event analysis are disclosed. According to an aspect, a method includes analyzing a plurality of a set of input data characteristics from a device under test. The method also includes totalizing the set of input data characteristics. The method also includes determining whether at least one of the plurality of the set of input data characteristics occurs above a quiescent level. Further, the method includes establishing an event in response to determining that at least one of the plurality of the set of input data characteristics occurs above the quiescent level. The method also includes creating a summary statistic based on the plurality of the set of input data characteristics. Further, the method includes storing the summary statistic and the event as a result.


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