The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Nov. 26, 2018
Applicant:

Bio-rad Europe Gmbh, Basel, CH;

Inventors:

Agnes Roseline Claude Pouzet, Saint Cyr L'Ecole, FR;

Vincent Doury, Chaville, FR;

Laurent Emmanuel Fournier, Versailles, FR;

Christophe Rene Roger Vedrine, Courbevoie, FR;

Assignee:

BIO-RAD EUROPE GMBH, Basel, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01); G01N 33/543 (2006.01); G01N 21/64 (2006.01); G01N 33/58 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54373 (2013.01); G01N 21/6428 (2013.01); G01N 21/6452 (2013.01); G01N 33/581 (2013.01); G01N 33/582 (2013.01); B01J 2219/00576 (2013.01); B01J 2219/00659 (2013.01); B01J 2219/00693 (2013.01); G01N 2021/6439 (2013.01); G01N 2458/30 (2013.01);
Abstract

The present invention relates to the use of a control marker for implementing analysis methods on spots, in particular in the context of multiplex analyses. The present invention thus relates to solid supports containing said control marker, their preparation method and their use in analysis methods. The present invention makes it possible to verify the presence, location and/or integrity of the spots at the end of the analysis method, and thus to secure the obtained results while guaranteeing that the yielded result indeed results from a present, intact and localized spot.


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