The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Jan. 30, 2018
Lg Chem, Ltd., Seoul, KR;
Abstract
A non-destructive inspection judgment system for inspecting a non-destructive inspection subject using ultrasonic waves, including an ultrasonic wave generator transmitting and receiving ultrasonic signals by generating ultrasonic waves to the non-destructive inspection subject placed on an inspection table, an interface transmitting an ultrasonic signal received from the ultrasonic wave generator to an ultrasonic wave generation data controller, the ultrasonic wave generation data controller processing ultrasonic wave data received from the interface, a sealing defect presence judger determining, using the processed ultrasonic wave data, whether a sealing defect is present, and a display displaying a result of the judgment on a monitor to detect an unsealed portion of an aluminum pouch.