The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Feb. 20, 2017
Applicant:

Merck Ltd., Tokyo, JP;

Inventors:

Kimihiko Yabe, Kobe, JP;

Hiroshi Ohki, Kobe, JP;

Takateru Matsunaga, Kobe, JP;

Mieko Otonashi, Kobe, JP;

Hideki Kinoshita, Kobe, JP;

Toru Watsuji, Kobe, JP;

Assignee:

Merck Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 27/44739 (2013.01); G01N 27/447 (2013.01); G01N 27/44743 (2013.01); G01N 35/10 (2013.01);
Abstract

Provided is a novel sample separating instrument and a novel sample analyzing device each of which can be suitably used for emission transfer. A sample separating instrument () for use in emission transfer includes: a separation medium (); and a holding section (), the holding section () having an opening () on an end part side, the separation medium () having an exposed part (), the exposed part () having extending parts () which extend on respective edge parts () of the holding section () which edge parts are located on respective both sides of the opening ().


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