The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Oct. 05, 2016
Hamamatsu Photonics K.k., Hamamatsu, JP;
Sekisui Medical Co., Ltd., Tokyo, JP;
Naoyuki Honda, Hamamatsu, JP;
Kengo Sadamori, Hamamatsu, JP;
Daichi Susuki, Hamamatsu, JP;
Keigo Kohno, Tokyo, JP;
Motoki Morita, Tokyo, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
SEKISUI MEDICAL CO., LTD., Tokyo, JP;
Abstract
An optical measuring device includes a measuring unit (an optical head and a control unit) that irradiates a detection portion of an immunochromatographic test piece with measurement light and measures light obtained from the detection portion due to the irradiation with the measurement light, and a determination unit that performs a determination regarding the immunochromatographic test piece on the basis of a determination according to a comparison of a measurement value obtained by the measuring unit with a preset threshold value, the measuring unit performs the measurement of the light obtained from the detection portion a plurality of times, and the determination unit performs a determination regarding the immunochromatographic test piece when the determination unit determines that a measurement value in an nth measurement is equal to or greater than the threshold value and also determines that a measurement value in an (n+1)th measurement is equal to or greater than the threshold value.