The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Aug. 22, 2016
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Mats Larsson, Sunnyvale, CA (US);

Kevin A. Papke, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); H01J 37/32 (2006.01); G01N 3/56 (2006.01);
U.S. Cl.
CPC ...
G01N 21/64 (2013.01); G01N 3/56 (2013.01); H01J 37/32082 (2013.01); H01J 37/32458 (2013.01); H01J 37/32467 (2013.01); H01J 37/32477 (2013.01); H01J 37/32697 (2013.01); H01J 37/32715 (2013.01); H01J 37/32935 (2013.01); G01N 2201/06113 (2013.01); H01J 2237/24592 (2013.01);
Abstract

The present invention generally relates method and part wear indicator for identifying an eroded chamber component in an etching or other plasma processing chamber. In one embodiment, a chamber component has a part wear indicator. The chamber component has a body. The body has a top surface and a bottom surface. A part wear indicator material is disposed in the chamber component body. The part wear indicator has a body. The body of the part wear indicator has a transparent first layer. A second layer has a tracer material disposed therein and wherein the first layer is closer to the top surface of the top surface than the second layer.


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