The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Oct. 22, 2019
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Miyuki Murakami, Hino, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/49 (2006.01); H04N 5/225 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
G01N 21/49 (2013.01); H04N 5/2256 (2013.01); H04N 5/2351 (2013.01); H04N 5/2356 (2013.01);
Abstract

A measurement apparatus includes: a projector configured to project pulse light or light whose intensity is periodically modulated onto a subject; an imaging sensor that includes a plurality of pixels, the imaging sensor being configured to image backscattered light of the light projected by the projector from the subject a plurality of times to output a plurality of image signals; a selection circuit configured to select, for each of the pixels, an image signal closest to a reference light amount from the plurality of image signals; and a characteristic calculation circuit configured to calculate, for each of the pixels, TOF information obtained when the image signal selected by the selection circuit is imaged, acquire light intensity information of the light projected by the projector, and calculate a characteristic of the subject based on the calculated TOF information and the acquired light intensity information.


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