The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Dec. 03, 2018
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Assignee:
HITACHI, LTD., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/05 (2006.01); G01N 21/25 (2006.01); G01N 1/10 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/05 (2013.01); G01N 1/10 (2013.01); G01N 21/255 (2013.01); G01N 21/31 (2013.01); G01N 2021/052 (2013.01);
Abstract
An analysis system is provided which enables an optical analysis with high accuracy. An analysis system A in which light is radiated on a liquid sample to analyze the sample includes a reaction partwhich includes a reaction tank, an inlet port, and an outlet port, an analysis partwhich includes an analysis cell, at least one light source part, and at least one light receiving part, and a flow path tubewhich includes a first flow pathand a second flow path. A measurement partof the analysis cellincludes a first measurement portionand a second measurement portion, which have mutually different sectional areas.