The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Jun. 18, 2018
Applicants:

Northwestern University, Evanston, IL (US);

American Biooptics, Llc, Chicago, IL (US);

Inventors:

Vadim Backman, Chicago, IL (US);

Bradley Gould, Evanston, IL (US);

Nikhil Mutyal, Foster City, CA (US);

Frank Garrett, Jr., Barrington, IL (US);

The Quyen Nguyen, Evanston, IL (US);

Michael Garrett, Wilmette, IL (US);

Assignees:

NORTHWESTERN UNIVERSITY, Evanston, IL (US);

AMERICAN BIOOPTICS, LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G01N 21/47 (2006.01); G01M 11/08 (2006.01);
U.S. Cl.
CPC ...
G01M 11/088 (2013.01); A61B 5/0075 (2013.01); A61B 5/0084 (2013.01); G01N 21/474 (2013.01); G01N 21/4785 (2013.01); A61B 2560/0233 (2013.01); G01N 2021/4742 (2013.01);
Abstract

An automated calibration system that includes a probe guide and a target assembly. The probe guide receives an optical probe, and the target assembly includes one or more calibration targets. The target assembly is slideable relative to the probe guide so that a first calibration target is aligned under the optical probe in a first position of the target assembly and a second calibration target is aligned under the optical probe in a second position of the target assembly.


Find Patent Forward Citations

Loading…