The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Feb. 23, 2020
Applicant:

Wuhan Institute of Physics and Mathematics, Chinese Academy of Science, Wuhan, CN;

Inventors:

Yi Zhang, Wuhan, CN;

Sihong Gu, Wuhan, CN;

Yuan Tian, Wuhan, CN;

Jiehua Chen, Wuhan, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01J 4/04 (2006.01); G02B 27/28 (2006.01); G01R 33/032 (2006.01);
U.S. Cl.
CPC ...
G01J 4/04 (2013.01); G02B 27/283 (2013.01); G02B 27/286 (2013.01); G01R 33/0322 (2013.01);
Abstract

An atomic sensing method, the method including providing a polarization converter; emitting a linearly polarized polychromatic laser beam to the polarization converter; converting, by the polarization converter, the linearly polarized polychromatic laser beam into a circularly-polarized laser beam and a linearly-polarized laser beam; combining the circularly-polarized laser beam and the linearly-polarized laser beam thereby yielding a multi-polarization polychromatic laser beam; transmitting the multi-polarization polychromatic laser beam to an atomic vapor cell comprising alkali metal atoms, polarizing the multi-polarization polychromatic laser beam into two laser beams, and detecting the two laser beams by two photodetectors, respectively.


Find Patent Forward Citations

Zhang, Yi. (2021). Atomic sensing method and chip-scale atomic sensor (U.S. Patent No. 10921191). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10921191

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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