The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Sep. 11, 2015
Applicant:
Wuhan Tailimeixin Healthcare Technologies Co., Ltd, Wuhan, CN;
Inventors:
Wenqiang Chen, Beijing, CN;
Chao Cai, Wuhan, CN;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/00 (2013.01); G01D 18/00 (2006.01); A61B 5/01 (2006.01); A61B 5/07 (2006.01); G01D 21/00 (2006.01); A61B 5/00 (2006.01); A61B 90/98 (2016.01); G01D 11/00 (2006.01);
U.S. Cl.
CPC ...
G01D 18/008 (2013.01); A61B 5/002 (2013.01); A61B 5/0008 (2013.01); A61B 5/01 (2013.01); A61B 5/073 (2013.01); A61B 5/6833 (2013.01); A61B 90/98 (2016.02); G01D 11/00 (2013.01); G01D 18/00 (2013.01); G01D 21/00 (2013.01); A61B 5/0006 (2013.01); A61B 5/0013 (2013.01); A61B 2560/0214 (2013.01); A61B 2560/0223 (2013.01); A61B 2560/0238 (2013.01); A61B 2560/0242 (2013.01);
Abstract
An integrated system and method for measuring and calibrating a parameter relating to an object or the environment is provided. The integrated measuring system may include a memory that may store a library of calibration formulas, a communication module that may retrieve information from a sensor, and a computing center that may perform calibration based on at least some of the received information.