The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Sep. 25, 2015
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Carmit Sahar, Tel-Aviv, IL;
Marcelo Blatt, Modiin, IL;
Alon Kaufman, Bnei-Dror, IL;
Roni Frumkes, Tel-Aviv, IL;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Methods and apparatus are provided for validating event scenarios using reference readings obtained from a plurality of sensors associated with one or more predefined event scenarios. If a reading from a first sensor satisfies a reference reading of the first sensor for at least one identified scenario in a scenario library, at least one additional sensor is identified from the identified scenario and a reading is obtained from the additional sensors. The identified scenario is validated when the readings of the additional sensors satisfy the reference reading for the additional sensors from the identified scenario. A confidence level is optionally determined based on the readings of the sensors in the identified scenario. The readings of the sensors are optionally monitored over time to update the confidence level of the identified scenario.