The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Aug. 02, 2018
Applicant:

Hiwin Mikrosystem Corp., Taichung, TW;

Inventors:

Heng-Sheng Hsiao, Taichung, TW;

Yin-Yuan Chen, Taichung, TW;

Tsan-Lin Chen, Taichung, TW;

Assignee:

HIWIN MIKROSYSTEM CORP., Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
G01D 5/34792 (2013.01); G01D 5/3473 (2013.01); G01D 5/34715 (2013.01);
Abstract

An optical positioning measurement device includes a light source module operable to emit light, an encoder module and a sensor module. The sensor module is configured to output electric signals relating to luminous flux of light received thereby via the encoder module. The encoder module having a first incremental code portion, a second incremental code portion and an absolute code portion. The first incremental code portion includes multiple first incremental code patterns that are equally distributed. The second incremental code portion includes multiple second incremental code patterns that are equally distributed. The second incremental code patterns are arranged more loosely than the first incremental code patterns.


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