The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Oct. 25, 2017
Industrial Technology Research Institute, Hsinchu, TW;
Yu-Wen Chen, New Taipei, TW;
Te-Mei Wang, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A three dimensional image measurement system including a first optical system and a second optical system is provided. The first optical system is adapted to output a structural light beam and a zero order light beam. There is an angle between the structural light beam and the zero order light beam. The first optical system performs an optical operation to project the structural light beam to a three dimensional object to obtain three dimensional information of the three dimensional object. The second optical system is adapted to receive the zero order light beam and perform another optical operation by using the zero order light beam. The first optical system includes a plurality of optical elements. The value of the angle between the structural light beam and the zero order light beam is determined according to position parameters of the optical elements.