The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Jun. 19, 2019
Applicant:

Us Synthetic Corporation, Orem, UT (US);

Inventors:

Mohammad N. Sani, Berkshire, GB;

Andrew E. Dadson, Provo, UT (US);

Assignee:

US SYNTHETIC CORPORATION, Orem, UT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 10/55 (2006.01); B24D 3/06 (2006.01); B24D 99/00 (2010.01);
U.S. Cl.
CPC ...
E21B 10/55 (2013.01); B24D 3/06 (2013.01); B24D 99/005 (2013.01);
Abstract

In an embodiment, a polycrystalline diamond compacts ('PDC') includes a substrate and a polycrystalline diamond ('PCD') table bonded to the substrate. The PCD table defines an upper surface and at least one peripheral surface. The PCD table includes a plurality of bonded diamond grains. The PCD table includes a first region adjacent to the substrate that includes a metallic constituent disposed interstitially between the bonded diamond grains thereof, and a leached second region extending inwardly from the upper surface and the at least one peripheral surface that is depleted of the metallic constituent. The leached second region exhibits a leach depth profile having a maximum leach depth that is measured from the upper surface. A leach depth of the leach depth profile decreases with lateral distance from a central axis of the PCD table and toward the at least one peripheral surface.


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