The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2021

Filed:

Jun. 07, 2019
Applicant:

Enf Technology Co., Ltd., Yongin-si, KR;

Inventors:

Dong Hyun Kim, Yongin-si, KR;

Hyeon Woo Park, Yongin-si, KR;

Du Won Lee, Yongin-si, KR;

Jang Woo Cho, Suwon-si, KR;

Myung Ho Lee, Hwaseong-si, KR;

Assignee:

ENF TECHNOLOGY CO., LTD., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09K 13/06 (2006.01); H01L 21/311 (2006.01); C08G 77/28 (2006.01); C09K 13/08 (2006.01); C08G 77/30 (2006.01); C08G 77/04 (2006.01); C08G 77/26 (2006.01);
U.S. Cl.
CPC ...
C09K 13/06 (2013.01); C08G 77/045 (2013.01); C08G 77/26 (2013.01); C08G 77/28 (2013.01); C08G 77/30 (2013.01); C09K 13/08 (2013.01); H01L 21/31111 (2013.01);
Abstract

Provided are a polysiloxane-based compound, a selective etching composition with respect to a silicon nitride layer including the polysiloxane-based compound, and a method of manufacturing a semiconductor device including the etching composition. The silicon nitride layer etching composition including the polysiloxane-based compound may selectively etch the silicon nitride layer relative to a silicon oxide layer, and have a significantly excellent etch selectivity ratio, and a small change in etch rate and a small change in etch selectivity ratio with respect to the silicon nitride layer even when time for using the composition increases or the composition is repeatedly used.


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