The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Jul. 09, 2018
Koninklijke Philips N.v., Eindhoven, NL;
Hanns-Ingo Maack, Norderstedt, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to a device for scatter correction in an X-ray image, the X-ray image () having a superimposed structured pattern, the device () comprising: an X-ray image receiving element (); a pattern remover (); and a first subtraction module (); wherein the X-ray image receiving element () is configured to receive an X-ray image () comprising a superimposed structured pattern (); wherein the pattern remover () is configured to remove the structured pattern () from the X-ray image () resulting in a pattern corrected X-ray image (); wherein the first subtraction module () is configured to subtract the pattern corrected X-ray image () from the X-ray image () resulting in a structured pattern image (); and wherein a contrast measurement unit () is configured to apply a local structure contrast measurement function to the structured pattern image () resulting in a structure contrast image (). The invention improves the scatter correction of an X-ray image.