The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Aug. 17, 2018
Applicant:
Spectrum Effect Inc., Kirkland, WA (US);
Inventors:
Rekha Menon, Kirkland, WA (US);
David James Ryan, Jackson, WY (US);
Assignee:
Spectrum Effect Inc., Kirkland, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/02 (2009.01); H04W 24/08 (2009.01); H04L 12/26 (2006.01); H04B 17/345 (2015.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/02 (2013.01); H04B 17/345 (2015.01); H04L 43/0811 (2013.01); H04L 43/16 (2013.01); H04W 24/08 (2013.01); H04W 24/10 (2013.01);
Abstract
Anomalies at nodes of a wireless network can be detected by receiving performance measurement (PM) data for a plurality of nodes in the wireless telecommunications network, accessing sets of binned data of the PM data for each node of the plurality of nodes, comparing at least one characteristic of the binned data for each node to at least one of a threshold value and the binned data for another node of the plurality of nodes, and determining whether an anomaly is present at each of the plurality of nodes based on a result of the comparison.