The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Oct. 25, 2017
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Toshihiko Oda, Kusatsu, JP;

Tetsuji Yamato, Yokohama, JP;

Shuichi Misumi, Kyoto, JP;

Sangryul Lee, Kusatsu, JP;

Ryota Yamada, Tokyo, JP;

Takeshi Naito, Ibaraki, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 67/12 (2013.01);
Abstract

One mode of the present invention is configured to acquire sensor-side metadata including a first label corresponding to a label showing a name given in order to identify event data, to acquire app-side metadata including a second label that is an event condition showing a condition of an event and corresponds to the label, to determine, in a case where sensing data satisfies a requirement of an application, whether the first label and the second label are identical, and to transmit, in the case where these labels are identical, a dataflow control command including information specifying a sensor, information specifying the application and the event condition included in the app-side metadata.


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