The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Mar. 27, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Danny Oz, Bat-Yam, IL;

Ilan Yosef, Petach Tikva, IL;

Itay Kaufman, Netanya, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01); G06F 9/50 (2006.01); G06F 1/32 (2019.01); G06F 15/173 (2006.01); G06F 1/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); H04L 41/0816 (2013.01);
Abstract

A method comprising: selecting a test for execution on a computing system; identifying a set of performance counters that is associated with the test; executing the test and the set of performance counters on the computing system, the test and the set of performance counters being executed concurrently with one another; generating an execution signature for the test based on the set of performance counters, the execution signature being generated while the test is being executed on the computing system; reconfiguring the test based on the execution signature, the test being reconfigured while the test is being executed on the computing system, wherein each of the performance counters in the set is associated with a different respective operational parameter of the computing system; wherein each of the performance counters in the set includes logic for collecting values of the performance counter's respective operational parameter.


Find Patent Forward Citations

Oz, Danny. (2021). Adaptive testing based on real-time analysis (U.S. Patent No. 10917327). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10917327

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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