The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Nov. 02, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Arkadiusz Sitek, Ashland, MA (US);

Yiting Xie, Cambridge, MA (US);

Ben Graf, Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30028 (2013.01); G06T 2207/30101 (2013.01); G06T 2207/30172 (2013.01);
Abstract

Systems and methods for determining an abnormality in an elongated structure in a three dimensional medical image. One system includes an electronic processor. The electronic processor is configured to determine a centerline of the elongated structure in the three dimensional medical image and determine a plurality of two dimensional cross sections of the three dimensional medical image based on the centerline. For each two dimensional cross section of the plurality of two dimensional cross sections, the electronic processor is configured to convert the two dimensional cross section to polar coordinates, fit a line to the elongated structure in the two dimensional cross section converted to polar coordinates, and reconvert the two dimensional cross section to Cartesian coordinates.


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