The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Dec. 26, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Michael T. Geroulo, Plattsburgh, NY (US);

Thomas R. Ervolina, Poughquag, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06Q 10/06 (2012.01); G06Q 10/08 (2012.01); G06F 16/951 (2019.01); G05B 19/418 (2006.01); G06N 3/08 (2006.01); G06N 7/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06Q 10/06315 (2013.01); G05B 19/418 (2013.01); G05B 19/41865 (2013.01); G06F 16/951 (2019.01); G06Q 10/06375 (2013.01); G06Q 10/06393 (2013.01); G06Q 10/087 (2013.01); G06Q 10/0875 (2013.01); G06N 3/08 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01);
Abstract

Systematically and comprehensively identifying and evaluating structure changes in MRP runs. A multi-step process employs a crawler analytic to: transform dated structure inputs to time based patterns which represent effectivity windows within the plan horizon for child parts on BOM or interplant records; employ a multi-stage multi dimensional recursive optimizing pattern matcher method to associate effectivity window patterns, within the current cycle MRP input space, across a sequential series of MRP cycles, and across like entities, into transition sets which likely represent shifts in BOM content and/or interplant relationships; tie changes to top level demand drivers and effected component items; rationalize in and cross cycle, cross location, structure differences with trends in component and driver demand to identify candidate soft spots in part and/or relationship changes which can negatively impact the exploded demand result; distill the analysis to a consumable view which visually renders the problem and impact.


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