The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Nov. 15, 2018
Applicant:

Toyota Research Institute, Inc., Los Altos, CA (US);

Inventor:

Wadim Kehl, San Francisco, CA (US);

Assignee:

Toyota Research Institute, Inc., Los Altos, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 1/00 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6256 (2013.01); G06K 9/6262 (2013.01);
Abstract

In one embodiment, example systems and methods relate to a manner of generating training data for a classifier or a regression function using labeled synthetic images and a mapping that accounts for the differences between synthetic images and real images. The mapping may be a neural network that was trained using image pairs that each include an image of an object and a synthetic image that is generated from the image of the object by overlaying a rendering of the object into the image. The mapping may recognize the differences between features of the object in the real image and features of the rendering of the object in the synthetic image such as color, contrast, sensor noise, etc. Later, a set of labeled synthetic images is received, and the mapping is used to generate training data from the labeled synthetic images.


Find Patent Forward Citations

Kehl, Wadim. (2021). System and method for generating training data from synthetic images (U.S. Patent No. 10915787). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10915787

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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