The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

May. 20, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Dongwoo Kang, Seoul, KR;

Jingu Heo, Yongin-si, KR;

Byong Min Kang, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00281 (2013.01); G06K 9/0061 (2013.01); G06K 9/00255 (2013.01); G06K 9/00261 (2013.01); G06T 7/33 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30201 (2013.01);
Abstract

An image processing method includes receiving an image frame, detecting a face region of a user in the image frame, aligning a plurality of preset feature points in a plurality of feature portions included in the face region, performing a first check on a result of the aligning based on a first region corresponding to a combination of the feature portions, performing a second check on the result of the aligning based on a second region corresponding to an individual feature portion of the feature portions, redetecting a face region based on a determination of a failure in passing at least one of the first check or the second check, and outputting information on the face region based on a determination of a success in passing the first check and the second check.


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