The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Feb. 22, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Dongyue Zhao, Beijing, CN;

Yaohai Huang, Beijing, CN;

Xian Li, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00281 (2013.01); G06K 9/00248 (2013.01); G06K 9/00275 (2013.01); G06K 9/6203 (2013.01); G06K 9/6209 (2013.01);
Abstract

One of the aspects of the present invention discloses a feature point detection method. The method comprises: acquiring a face region in an input image; acquiring first positions of first feature points and second feature points according to a pre-generated first model; estimating second positions of the first feature points according to the first positions of the first feature points and pre-generated second models; detecting third positions of the first feature points and the second feature points according to the second positions of the first feature points, the first positions of the second feature points and pre-generated third models. According to the present invention, the final detected face shape could approach to the actual face shape much more.


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