The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Mar. 28, 2016
Hitachi, Ltd., Tokyo, JP;
Susumu Serita, Tokyo, JP;
Yoshiyuki Tajima, Tokyo, JP;
Tomoaki Akitomi, Tokyo, JP;
Fumiya Kudo, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Provided is a technique for extracting a factor (event pattern) that has an influence on an objective index (objective variable). A data analysis device according to the present disclosure performs: a process of generating, with respect to explanatory variable data included in data to be analyzed, a time-series pattern in a predetermined range; a process of calculating a correlation value between the time-series pattern and at least one item of objective variable data included in the data to be analyzed; and a process of outputting, together with the correlation value, the time-series pattern corresponding to the correlation value as an analysis result.