The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

May. 26, 2017
Applicant:

Netapp, Inc., Sunnyvale, CA (US);

Inventors:

Tim K. Emami, San Jose, CA (US);

Charles Binford, Wichita, KS (US);

Ratnesh Gupta, Alameda, CA (US);

Assignee:

NETAPP, INC., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); G06F 11/10 (2006.01); G06F 11/16 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1446 (2013.01); G06F 11/108 (2013.01); G06F 11/1092 (2013.01); G06F 11/14 (2013.01); G06F 11/16 (2013.01); G06F 11/1666 (2013.01); G06F 11/3034 (2013.01);
Abstract

Methods, non-transitory computer readable media, and computing devices that determine when a storage element of a data storage device has failed. Address(es) mapped to the failed storage element are identified, when the determining indicates that the storage element has failed. Data corresponding to the address(es) is regenerated according to a data loss protection and recovery scheme (e.g., a RAID scheme). The regenerated data is written to other storage element(s) of the data storage device in order to remap the address(es) to the other storage element(s). This technology allows a data storage device (e.g., an SSD) to be repaired in-place following a failure of storage element(s) (e.g., a die) of the data storage device. Advantageously, entire data storage devices do not have to be failed with this technology as a result of a failure of an individual storage element, thereby reducing data storage device failure rates and associated overhead.


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