The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Jan. 25, 2018
Zhejiang University, Zhejiang, CN;
Zhenrong Zheng, Hangzhou, CN;
Xiao Tao, Hangzhou, CN;
Wentao Zhang, Hangzhou, CN;
Chenning Tao, Hangzhou, CN;
Haifeng Li, Hangzhou, CN;
Xu Liu, Hangzhou, CN;
ZHEJIANG UNIVERSITY, Zhejiang, CN;
Abstract
The invention discloses a wide-field multi-scale high-resolution microscopic imaging system, which includes a light source, a sample, a microscope imaging objective system, an acquisition system, and a workstation. The microscope imaging objective system is used for forming an image after a light beam emitted by the light source illuminates the sample. To obtain a wide-field curved image plane, the acquisition system includes an acquisition lens array for subfield acquisition of the curved image plane, and a camera array for secondary imaging. The workstation is used for analyzing the acquired image in overlapping fields of view, and performing image splicing based on the fields of view, to finally obtain a wide-field high-resolution image. Because of the desire for an improvement to an imaging method, this invention realizes multi-scale high-resolution observation from cells, tissues, to organs while ensuring a wide field of view.