The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Sep. 04, 2019
Applicant:
The United States of America, As Represented BY the Secretary, Department of Health and Human Services, Bethesda, MD (US);
Inventors:
Hari Shroff, Bethesda, MD (US);
Justin Taraska, Bethesda, MD (US);
John Giannini, Bethesda, MD (US);
Yicong Wu, Bethesda, MD (US);
Abhishek Kumar, Bethesda, MD (US);
Min Guo, Bethesda, MD (US);
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/16 (2006.01); G02B 21/00 (2006.01); G01N 21/64 (2006.01); G02B 27/58 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/16 (2013.01); G01N 21/648 (2013.01); G01N 21/6458 (2013.01); G02B 21/0032 (2013.01); G02B 21/0044 (2013.01); G02B 21/0076 (2013.01); G02B 21/36 (2013.01); G02B 27/58 (2013.01); G01N 2021/6463 (2013.01); G01N 2201/105 (2013.01); G02B 21/0048 (2013.01);
Abstract
Various embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are herein disclosed.