The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Aug. 30, 2017
Applicant:
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Inventors:
Assignee:
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 21/64 (2006.01); G02B 21/36 (2006.01); G02B 27/58 (2006.01); G02B 21/26 (2006.01); G02B 21/33 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G01N 21/6458 (2013.01); G02B 21/008 (2013.01); G02B 21/0032 (2013.01); G02B 21/0068 (2013.01); G02B 21/26 (2013.01); G02B 21/33 (2013.01); G02B 21/367 (2013.01); G02B 27/58 (2013.01);
Abstract
A superresolution STED-NSIM apparatus having an epifluorescence architecture utilizing a 2D structured STED pattern having a N.A. less than a N.A. of the microscope objective and no surface plasmon resonance (SPR) effects. A superresolution STED-NSIM imaging method using a fully deterministic imaging processing method, in which a pre-calibrated set of parameters are used to process all image data.