The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Apr. 29, 2019
Rohde & Schwarz Gmbh & Co. KG, München, DE;
Sven Barthel, Chemnitz, DE;
Sebastian Petzsch, Chemnitz, DE;
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Abstract
The present invention relates to a test system for testing a device under test, comprising a signal generating unit being connectable to an input node of the device under test and being adapted to generate a test signal to be applied to the input node of the device under test, wherein the test signal comprises a plurality of frequency peaks at different frequencies. A receiving unit is connectable to an output node of the device under test and is adapted to receive a response signal from the device under test in response to the test signal. An analyzing unit for analyzing the device under test is adapted to determine at least one of a gain value and a phase value based on the test signal generated by the signal generating unit and the response signal received by the receiving unit.