The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

May. 03, 2018
Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Chao Kong, Beijing, CN;

Kening Zheng, Beijing, CN;

Dong Chen, Beijing, CN;

Yinan Liang, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); H05B 45/50 (2020.01); H05B 45/00 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2642 (2013.01); H05B 45/50 (2020.01); H05B 45/60 (2020.01); Y02B 20/30 (2013.01);
Abstract

An aging test method for a light emitting device is provided. The aging test method includes: collecting, in an aging process applied to the light emitting device, an initial value of a first characteristic parameter of the light emitting device and an initial test time point; collecting a current value of the first characteristic parameter and a current test time point (step S); generating a feature line according to the initial value, the current value, the initial test time point, and the current test time point, and calculating a slope of the feature line; determining whether the slope of the feature line is greater than or equal to a predetermined threshold and less than 0, and returning to the step Sif a result of the determination is NO; and terminating the aging process applied to the light emitting device if the result of the determination is YES.


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