The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2021

Filed:

Nov. 06, 2018
Applicant:

Olympus Corporation, Hachioji, JP;

Inventors:

Mayu Ogawa, Tokyo, JP;

Kazuhito Goda, Tokyo, JP;

Kosuke Takagi, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 33/50 (2006.01); G01N 21/64 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5011 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G01N 2021/1787 (2013.01); G01N 2021/6439 (2013.01);
Abstract

The present invention provides a method for evaluating a protrusion-forming ability of cell spheroids, comprising step (a) of imaging a cell spheroid labeled with a fluorescent substance using a fluorescence microscope at a resolution capable of identifying individual cells, and acquiring a plane tomographic image of a fluorescence emitted from the fluorescent substance, step (b) of analyzing the plane tomographic image acquired in step (a) to determine a protrusion part of the cell spheroid, and step (c) of evaluating a protrusion-forming ability of the cell spheroid based on the protrusion part determined in step (b).


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