The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Apr. 15, 2016
Alma Mater Studiorum-universita Di Bologna, Bologna, IT;
Luca De Marchi, Bologna, IT;
Nicola Testoni, Casalecchio di Reno, IT;
Alessandro Marzani, Bologna, IT;
ALMA MATER STUDIORUM-UNIVERSITA DI BOLOGNA, Bologna, IT;
Abstract
The present invention relates to a method for making a device for monitoring the structural integrity of structures such as beams, plates and shells, made of isotropic, anisotropic and/or laminated material, and to such a device. The method provides to define a asymmetric directivity function D(k1,k2) that has, in the domain of wave numbers, a plurality of maxima arranged on different concentric circumferences having center in the origin of the axes. Then a load distribution in spatial coordinates f(x1,x2) is computed by inverse Fourier transform of the directivity function D(k1,k2). Then therefore the device is made with the electrodes, whose shape is obtained by gathering the values of the load distribution f(x1,x2) in the plane having for coordinates the set of real numbers and imaginary numbers, defining at least two sectors of said plane that comprise at least one real value and one imaginary value.