The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Jan. 31, 2019
Microtec S.r.l., Bressanone, IT;
Enrico Ursella, Mestre, IT;
Giancarlo Zane, Mestre, IT;
Marco Boschetti, Levico Terme, IT;
Simone Faccini, Bolzano, IT;
MICROTEC S.R.L., Bressanone, IT;
Abstract
This disclosure relates to a method for non-destructive inspection of a fruit () having an axis of rotational symmetry (). The method comprises the step of positioning the fruit () in such a way that its axis of rotational symmetry () has an orientation that is substantially parallel to a predetermined plane () and the step of radiographing the fruit (), where the direction of emission of X-rays is substantially perpendicular to said predetermined plane () and an X-ray image obtained () lies on said predetermined plane (). The X-ray image obtained () is processed to calculate, at corresponding points of the X-ray image (), respective values of attenuation of the X-ray signal through the fruit (). The X-ray image () is divided into a plurality of sections () which are perpendicular to the projection () of the axis of rotational symmetry () on the predetermined plane (). Each section () is the projection of a corresponding slice of the fruit () that is substantially perpendicular to the axis of rotational symmetry (). For each section (), the deviation between a signal attenuation trend obtained from processing the X-ray image and a reference trend, or the deviation between a trend of a local coefficient of average attenuation obtained from processing the X-ray image and a trend with constant value, is examined in order to identify any anomalies, discontinuities or variations which are indicative of respective non-uniformities in the corresponding slice of fruit. This disclosure also relates to an apparatus () for carrying out a non-destructive inspection of a fruit () having an axis of rotational symmetry (), said apparatus being configured for implementing the method according to the disclosure.