The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Jul. 06, 2018
Applicant:
Case Western Reserve University, Cleveland, OH (US);
Inventors:
Ozan Akkus, Cleveland Heights, OH (US);
Shan Yang, Cleveland Heights, OH (US);
Assignee:
CASE WESTERN RESERVE UNIVERSITY, Cleveland, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01J 3/28 (2006.01); G01J 3/44 (2006.01); G01J 3/02 (2006.01); G01J 3/10 (2006.01); G01J 3/26 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/0205 (2013.01); G01J 3/0208 (2013.01); G01J 3/0224 (2013.01); G01J 3/0227 (2013.01); G01J 3/0235 (2013.01); G01J 3/0294 (2013.01); G01J 3/10 (2013.01); G01J 3/26 (2013.01); G01J 3/2823 (2013.01); G01J 3/44 (2013.01); G01J 3/4412 (2013.01); G01J 3/508 (2013.01); G01N 2201/06113 (2013.01);
Abstract
A hyperspectral Raman imaging system having the ability to focus on excitation laser beam over a relatively wide field of view due to the use of a lens array, in particular a microlens array. Hyperspectral selection is provided in one embodiment through the use of dual-axis controlled dielectric filtration. Methods for analyzing materials with the system are disclosed. The device or system can be used in generally any application where investigation of materials is required.