The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Mar. 27, 2017
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Kazuyoshi Takeda, Chino, JP;
Assignee:
SEIKO EPSON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 7/02 (2006.01); G01M 5/00 (2006.01); G01H 13/00 (2006.01);
U.S. Cl.
CPC ...
G01M 7/025 (2013.01); G01H 13/00 (2013.01); G01M 5/0008 (2013.01); G01M 5/0041 (2013.01); G01M 5/0066 (2013.01);
Abstract
An observation system includes an information acquiring section configured to acquire sensor information from a sensor section set in a structure and configured to detect vibration of the structure and a processing section configured to calculate information concerning a peak vibration frequency of the vibration on the basis of the sensor information and determine a surface state of the structure on the basis of the information concerning the peak vibration frequency.
Takeda, Kazuyoshi. (2021). Observation system and control method for observation system (U.S. Patent No. 10914654). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10914654
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile